Five courses are currently offered in the Semiconductor Materials/Devices Track: 

ELCT 363 Semiconductor Materials/Devices Fundamentals

ELCT 563 Processing of Semiconductor Devices

ELCT 566 Semiconductor Photonic Devices

ELCT 574 Semiconductor Electronic Devices

ELCT 582 Lab Course for Processing of Semiconductor Devices 

By conclusion of this course students should be able to:

1. Demonstrate the knowledge of the basic properties of semiconductor materials, different types of crystals lattices, characteristic planes and directions in the crystals as well as the basic techniques for semiconductor materials growth such as bulk crystal growth and epitaxial growth.

2. Depict and explain the energy band diagrams for semiconductor crystals.

3. Understand the concepts of free electrons and holes in semiconductors; calculate the free carrier concentration.

4. Demonstrate proficiency in evaluating of electrical and optical parameters of semiconductor materials, such as resistivity, Hall voltage, drift and diffusion currents.

5. Manipulate the equations and graphs describing light absorption / emission in semiconductors.

6. Draw the band diagrams, describe the major properties and solve the problems on the properties of p-n junctions in equilibrium and under forward and reverse bias.

By the conclusion of this course, students will learn the fundamentals of: 

1. Various techniques for an epitaxial growth of thin films including Metal Organic Vapor Phase Epitaxy, Molecular Beam Epitaxy.

2. Optical Lithography, masks design concepts, photoresist properties, alignment techniques, electron beam lithography systems.

3. Physics, methods and systems for the deposition of thin films of metals and dielectrics. Sputtering technique, electron beam deposition, thermal evaporation.

4. Etching processes in microelectronics: wet etching, plasma etching, reactive ion etching, lift-off technique.

5. Principles and approaches to semiconductor device packaging.

By conclusion of this course students should be able to:

1. Understand the mechanisms of light absorption in semiconductors. Calculate absorption/transmission  coefficients.

2. Evaluate the main parameters (responsivity, speed of response, peak wavelength) of different types of photodetectors: photoconductors, Schottky photodiodes, pin photodiodes etc.

3. Understand the principle of light emission from semiconductor devices; electron-hole injection in p-n junctions, recombination mechanisms.

4. Manipulate the expressions and evaluate optical output power, emission efficiency spectral properties of light emitting diodes.

5. Understand the principle and evaluate the parameters of semiconductor lasers; calculate the threshold current.

6. Estimate the parameters of integrated optical waveguiding systems.

By conclusion of this course students should be able to:

1. Depict and explain the typical structures of different type of field-effect transistors (FET), including Junction FET, Metal-Semiconductor FET, Metal-Oxide-Semiconductor FET;

2. Manipulate the equations and evaluate the main parameters of the field-effect transistors, such as threshold voltage, peak current, transconductance, cut-off frequency;

3. Draw simple circuits based on FETs, calculate current and voltage gain, find the operation point using the load line approach.

4. Calculate the main transport parameters of bipolar junction transistors (BJT) such as base transport factor, emitter injection efficiency, current gain.

5. Evaluate the impact of Early effect and emitter current crowding on BJT performance.

6. Depict an amplifier circuits and solve the problems on amplifier operating point and current/voltage gain.

This course will provide the students with practical training in:

1. Optical Lithography, photoresist preparation, alignment techniques.

2. Deposition of thin films of metals and dielectrics. Sputtering technique, electron beam deposition, thermal evaporation.

3. Etching processes in microelectronics: wet etching, reactive ion etching, lift-off technique.

4. Semiconductor device packaging and testing