Richard Mellitz

richard.mellitz@intel.com

Richard Mellitz is presently a Principal Engineer within the Enterprise Server and Platform Division of Intel. His primary responsibility is to ensure the total signal integrity of multi-processor server systems. Since joining Intel in 1998 Richard has been key member of various key processor and I/O bus teams including Itanium®, Pentium® 4, and PCI Express®. He led the signal integrity efforts for a number of Intel’s enterprises servers.  Prior to working at Intel, Mr. Mellitz lead signal integrity for server development at ATT/NCR for 4 years.  Five years of signal transmission research were the later part of an 18 year career at Digital Equipment Corporation. Early in Mr. Mellitz’s career at digital he lead the electrical and software development may new, at the time, automation test equipment systems like a multi-axis prober, automated TDR system, automated power supply tester, automated analog tester, automated impedance tester, and voltage contrast electron beam tester.  Mr. Mellitz was hirer by Digital in 1976 because of reputation gained in developing automatic test equipment for Cambridge Memories. As coop at Perkin-Elmer in 1967-1970 he develop simulation for the Apollo stellar guidance control and wrote an operating system to analyze U2 camera film.

Richard holds signal integrity patents in time domain reflectometry, clocking architecture, and memory busing as well as delivering a number signal integrity papers at PC industry design conferences.  He also wrote the IPC TDR standard that is used throughout the PWB industry.

Education:

BSEE ‘71, MSEE ’72 – Northeastern University. Eta Kappa Nu, Tau Beta Pi

PAT. NO.  Title

  1. 6,421,391  Transmission line for high-frequency clock 
  2. 6,078,965  Transmission line system for printed circuits 
  3. 5,990,721  High-speed synchronous clock generated by standing wave 
  4. 5,825,630  Electronic circuit board including a second circuit board attached there to provide an area of increased circuit density 
  5. 5,596,283  Continuous motion electrical circuit interconnect test method and apparatus 
  6. 5,498,965  Driving point reference plane time domain reflectometry method for measuring characteristic impedance 
  7. 5,256,975  Manually-operated continuity/shorts test probe for bare interconnection packages 
  8. 5,017,863  Electro-emissive laser stimulated test