
Tangali Sudarshan Professor
Department Chair Carolina Distinguished
Professor
Department of Electrical Engineering 301
S. Main Street, Rm. 3A79 University of South
Carolina, Columbia 29208 Phone 803.777.5174
Fax 803.777.8045
e-mail
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Tangali S. Sudarshan
Professor Department Chair Carolina
Distinguished Professor
Dr. Sudarshan's specializations and research
interests include:
- Novel techniques of growth of silicon
carbide (SiC) bulk and epitaxial films
- Surface modification to produce porous SiC
- SiC material and device processing –
wafering, surface polishing, oxidation, mask
technology, dopant diffusion, and metalization
- Fabrication and characterization of SiC high
power Schottky and pn diodes
- Novel defect characterization methods for
wide bandgap semiconductors. High field effects
in SiC-based electronic materials and devices
- High power solid-state switches; electron
emission from thin films, as cold cathodes, for
applications in field emission displays
- Microspacer insulation for flat panel
displays
- Solid, liquid and gas insulated systems for
high voltage power apparatus, underground power
cable, overhead transmission systems and pulsed
power systems
- Surface flashover of solid dielectrics and
photoconducting materials in high vacuum and
compressed gas systems
- Fast high voltage and current diagnostics,
and low light level imaging; electric field
studies using numerical techniques
- Insulator degradation and aging, coronas and
arcs, power system protection.
Education
- Ph. D., Electrical Engineering (High Voltage
Electrical Engr.), University of Waterloo,
Ontario, October 1974. Thesis title: Flashover
of Solid Insulators in Vacuum.
- M. A. Sc., Electrical Engineering (High
Voltage Engineering) University of Waterloo,
Ontario, Canada, August 1972, Thesis title:
Field Enhancement Due to Solid Insulators
Subjected to High DC Stresses in Vacuum.
- M. Sc., Physics (Solid state), University of
Mysore, Mysore, India, June, 1970.
- B. Sc., (Physics, Mathematics, and
Chemistry), University of Bangalore, Bangalore,
India, May 1968.
Selected Publications
- "Investigations of defect evolution and
basal plane dislocation elimination in CVD
epitaxial growth of silicon carbide on eutectic
etched epilayers," Haizheng Song, Tawhid Rana,
and Tangali S. Sudarshan, Journal of Crystal
Growth, v. 320, Issue 1, p. 95-102, April
2011.
- "Effect of threading screw and edge
dislocations on transport properties of 4H-SiC
homoepitaxial layers," by S. I. Maximenko, J. A.
Freitas, Jr., R. L. Myers-Ward, K. K. Lew, B. L.
VanMil, C. R. Eddy, Jr., D. K. Gaskill, P. G.
Muzykov, and T. S. Sudarshan, Journal of
Applied Physics, 108, 013708, July 8, 2010.
- "Cathodoluminescence Study of the Properties
of Stacking Faults in 4H-SiC Homoepitaxial
Layers," by Serguei I. Maximenko, Jaime A.
Freitas, Jr., Paul B. Klein, Amitesh
Shrivastava, and Tangali S. Sudarshan,
Applied Physics Letters, 94, 092101, March
2009.
- "Physical Phenomena Affecting Performance
and Reliability of 4H-SiC Bipolar Junction
Transistors," by Peter G. Muzykov, Robert M.
Kennedy, Qingchun (Jon) Zhang, Craig Capell, Al
Burk, Anant Agarwal, Tangali S. Sudarshan,
Microelectronics Reliability, Vol. 49, Issue
1, pp. 32-37, January 2009.
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