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The University of South Carolina
Department of Electrical Engineering
Thesis Defense

Stage Design Of A UHV Scanning Tunneling Microscope

Kai Jiang

Candidate, Master of Science, Electrical Engineering

Advisor: Dr. Jixin Yu

When: Wednesday, April 04, 2007, at 2:00PM
Where: Room 3D05 in Swearingen Center

Abstract:

The Scanning Tunneling Microscope (STM) allows scientist to visualize the surface electron density, and hence to infer the position of individual atoms and molecules on the lattice surface. Vibration isolation is extraordinary essential for achieving atomic resolution images. This work provides a brief description of scanning tunneling mechanism and introduction of a unique thermally compensated tube scanner design, featuring inertial sample translation and sample position adjustment while within tunneling distance. It discusses the design of a double stage vibration isolation system for the STM scanner, including its comparisons with initial single stage system. Several guidelines are provided for designing a robust vibration isolation system.

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